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Electron-Beam-Induced Current Observation of Misfit Dislocations at Si1-XGeX/Si Interfaces

Electron-Beam-Induced Current Observation of Misfit Dislocations at Si1-XGeX/Si Interfaces

Y. Kohama; Y. Watanabe; Y. Fukuda
  • 作者Y. Kohama; Y. Watanabe; Y. Fukuda
  • 文件大小1347.14KB
  • 发表时间1987
  • DOI10.1143/JJAP.26.L1944
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