SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices - Approaches To Enhancing The Sensitivity Of Direct Coupled Photoacoustic Spectroscopy As Applied To Gaas
Janousek, Bruce K.; Carscallen, Richard C.; Glembocki, Orest J.; Pollak, Fred H.; Song, Jin-Joo
- 作者Janousek, Bruce K.; Carscallen, Richard C.; Glembocki, Orest J.; Pollak, Fred H.; Song, Jin-Joo
- 卷第794卷
- 印刷ISSN0277-786X
- 文件大小231.19KB
- 发表时间1987
- DOI10.1117/12.940902
- 页码121-127