Surface roughness and transverse magnetic field dependence of the Hall coefficient and the magnetoresistance in thin metal films

• 作者C. R. Tellier
• 卷第22卷
• 期第8期
• 印刷ISSN0022-2461
• 电子ISSN1573-4803
• 文件大小595.46KB
• 发表时间1987-08
• DOI10.1007/bf01086489
• 页码2906-2912