Critical underfocus in low-magnification electron microscopy: Rationale and practice
- 作者Dr. Wolf H. Fahrenbach; John H. Luft
- 卷第8卷
- 期第4期
- 印刷ISSN1059-910X
- 电子ISSN1097-0029
- 文件大小1346.11KB
- 发表时间1988
- DOI10.1002/jemt.1060080411
- 页码433-439
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