SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - <title>Polarization measurements of the extreme ultraviolet (EUV) emission following excitation and ionization-excitation of helium by fast electron, proton, and molecular hydrogen (H<formula><inf><roman>2</roman></inf></formula>+ and H<formula><inf><roman>3</roman></inf></formula>+) impact</title>Merabet, Hocine; Bruch, Reinhard F.; Fuelling, Stephan; Bartschat, K.; Godunov, Alexander; McGuire, James H.; Grum-Grzhimailo, A. N.; Goldstein, Dennis H.; Chenault, David B. · 2002

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