Piezoreflectance as a supplement to photoreflectance for nondestructive characterization of GaAs/AlxGa1−xAs multiple quantum wells
- 作者R. L. Tober; A. L. Smirl; T. F. Boggess; J. N. Schulman
- 文件大小786.08KB
- 发表时间1988
- DOI10.1063/1.341251
海量图书期刊资源，随时随地畅享阅读乐趣