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SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Characterization of Very High Speed Semiconductor Devices and Integrated Circuits - <title>Electrical Sampling Techniques</title>

SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Characterization of Very High Speed Semiconductor Devices and Integrated Circuits - Electrical Sampling Techniques

Riad, Sedki M.; Jain, Ravinder K.

作者Riad, Sedki M.; Jain, Ravinder K.
卷第795卷
印刷ISSN0277-786X
文件大小556.57KB
发表时间1988
DOI10.1117/12.940967
页码120-131

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