Detection of excess crystalline As in GaAs: Nation oxide overlayers by Raman scattering

• 作者Mukesh Jain; Guru Datta; P Venkataraman; S C Abbi; K P Jain
• 卷第32卷
• 期第5期
• 印刷ISSN0304-4289
• 电子ISSN0973-7111
• 文件大小280.72KB
• 发表时间1989-05
• DOI10.1007/bf02847388
• 页码641-646