student briefing extra
- 期刊名称Physiotherapy
- 作者Layritz, Christian; Muschiol, Gerd; Flohr, Thomas; Bietau, Christian; Marwan, Mohamed; Schuhbaeck, Annika; Schmid, Jasmin; Ropers, Dieter; Achenbach, Stephan; Pflederer, Tobias
- 卷第75卷
- 期第1期
- 印刷ISSN0031-9406
- 文件大小413.66KB
- 发表时间1989-1
- DOI10.1016/S0031-9406(10)62935-5
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Resistive Ternary Content Addressable Memory Systems for Data-Intensive ComputingGuo, Qing; Guo, Xiaochen; Bai, Yuxin; Patel, Ravi; Ipek, Engin; Friedman, Eby G. · IEEE Micro · 2015
Reducing Switching Latency and Energy in STT-MRAM Caches With Field-Assisted WritingPatel, Ravi; Guo, Xiaochen; Guo, Qing; Ipek, Engin; Friedman, Eby G. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2015
[ACM Press the 40th Annual International Symposium - Tel-Aviv, Israel (2013.06.23-2013.06.27)] Proceedings of the 40th Annual International Symposium on Computer Architecture - ISCA '13 - AC-DIMMGuo, Qing; Guo, Xiaochen; Patel, Ravi; Ipek, Engin; Friedman, Eby G. · 2013
[IEEE 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Melbourne VIC, Australia (2014.6.1-2014.6.5)] 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Field driven STT-MRAM cell for reduced switching latency and energyPatel, Ravi; Ipek, Engin; Friedman, Eby G. · 2014
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Editorial boardMicroelectronics Journal · 2013
Timing characterization and constraining toolAmrozik, Piotr; Napieralski, Andrzej · Microelectronics Journal · 2014
Editorial boardMicroelectronics Journal · 2013
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