Scanning tunneling microscopy topography of electron-beam evaporated niobium thin films in Nb-NbOx-Pb tunnel junctions on quartz substrates: D G Walmsley et al, J Vac Sci Technol, A6, 1988, 404–407

• 卷第39卷
• 期第10期
• 印刷ISSN0042-207X
• 文件大小153.27KB
• 发表时间1989
• DOI10.1016/0042-207x(89)91025-7