Direct observation of a 7 × 7 superstructure at the amorphous Si/Si(111) interface by cross-sectional high resolution transmission electron microscopy

• 作者Akira Sakai; Toru Tatsumi; Koichi Ishida
• 卷第224卷
• 印刷ISSN0167-2584
• 文件大小1707.36KB
• 发表时间1989
• DOI10.1016/0167-2584(89)90134-5