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Characterization of ceramic films and interfaces by electron microscopic and spectroscopic techniques

Characterization of ceramic films and interfaces by electron microscopic and spectroscopic techniques

A. Erdemir; C.C. Cheng
  • 作者A. Erdemir; C.C. Cheng
  • 卷第29卷
  • 印刷ISSN0304-3991
  • 文件大小1345.92KB
  • 发表时间1989
  • DOI10.1016/0304-3991(89)90254-4
  • 页码266-276
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