[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Optical system spectral transmission measurements in the visible and infrared
Mei, E.Y.C.; Gallinger, D.A.
- 作者Mei, E.Y.C.; Gallinger, D.A.
- 文件大小414.85KB
- 发表时间1989
- DOI10.1109/autest.1989.81128
- 页码242-248