[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Topological testing
Malek, M.; Mourad, A.; Pandya, M.
- 作者Malek, M.; Mourad, A.; Pandya, M.
- 文件大小764.27KB
- 发表时间1989
- DOI10.1109/test.1989.82283
- 页码103-110