![[IEEE 2008 7th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Cancun, Mexico (2008.04.28-2008.04.30)] 2008 7th International Caribbean Conference on Devices, Circuits and Systems - Design and modeling of an RFIC pad structure and probe contact impedance correction for on-wafer measurements]()
[IEEE 2008 7th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Cancun, Mexico (2008.04.28-2008.04.30)] 2008 7th International Caribbean Conference on Devices, Circuits and Systems - Design and modeling of an RFIC pad structure and probe contact impedance correction for on-wafer measurementsCapovilla, C. E.; Tavora A. S., A.; Kretly, L. C. · 2008