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Modulation spectroscopy characterization of MOCVD semiconductors and semiconductors structures

Modulation spectroscopy characterization of MOCVD semiconductors and semiconductors structures

Fred H. Pollak; H. Shen

作者Fred H. Pollak; H. Shen
卷第98卷
印刷ISSN0022-0248
文件大小1081.07KB
发表时间1989
DOI10.1016/0022-0248(89)90185-1
页码53-64

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