Single-event charge enhancement in SOI devices
- 作者Massengill, L.W.; Kerns, E.V., Jr.; Kerns, S.E.; Alles, M.L.
- 卷第11卷
- 期第2期
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小202.93KB
- 发表时间1990
- DOI10.1109/55.46941
- 页码98-99
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