Contactless measurements of rapidly thermal processed MBE GaAs on Si and GaAs wafers
- 作者Akira Usami; Akira Ito; Yutaka Tokuda; Hiroyuki Kano; Takao Wada
- 卷第103卷
- 印刷ISSN0022-0248
- 文件大小492.31KB
- 发表时间1990
- DOI10.1016/0022-0248(90)90210-c
- 页码350-356
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