A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

• 作者M. Saga; R. Uemori; M. Tanino; H. Morikawa
• 卷第246卷
• 印刷ISSN0167-2584
• 文件大小64.72KB
• 发表时间1990
• DOI10.1016/0167-2584(90)90038-9