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Film thickness dependence of critical current density and microstructure for epitaxial YBa
<sub/>2</sub>
Cu
<sub/>3</sub>
O
<sub/>7-x</sub>
films

Film thickness dependence of critical current density and microstructure for epitaxial YBa ₂ Cu ₃ O _7-x films

Mogro-Campero, A; Turner, L G; Hall, E L; Lewis, N; Peluso, L A; Balz, W E

期刊名称Superconductor Science and Technology
作者Mogro-Campero, A; Turner, L G; Hall, E L; Lewis, N; Peluso, L A; Balz, W E
卷第3卷
期第2期
印刷ISSN0953-2048
电子ISSN1361-6668
文件大小688.41KB
发表时间1990-02-01
DOI10.1088/0953-2048/3/2/002
页码62-66

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