SPIE Proceedings [SPIE Semi - DL tentative - San Diego, CA (Thursday 1 March 1990)] Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors III - Ultrafast laser probe of interband absorption edges in 3-D and 2-D semiconductors
Downer, Michael C.; Reitze, David H.; Focht, Glenn; Alfano, Robert R.
- 作者Downer, Michael C.; Reitze, David H.; Focht, Glenn; Alfano, Robert R.
- 卷第1282卷
- 印刷ISSN0277-786X
- 文件大小601.80KB
- 发表时间1990
- DOI10.1117/12.20713
- 页码121-131