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SPIE Proceedings [SPIE Semi - DL tentative - San Diego, CA (Thursday 1 March 1990)] Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors III - <title>Ultrafast laser probe of interband absorption edges in 3-D and 2-D semiconductors</title>

SPIE Proceedings [SPIE Semi - DL tentative - San Diego, CA (Thursday 1 March 1990)] Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors III - Ultrafast laser probe of interband absorption edges in 3-D and 2-D semiconductors

Downer, Michael C.; Reitze, David H.; Focht, Glenn; Alfano, Robert R.
  • 作者Downer, Michael C.; Reitze, David H.; Focht, Glenn; Alfano, Robert R.
  • 卷第1282卷
  • 印刷ISSN0277-786X
  • 文件大小601.80KB
  • 发表时间1990
  • DOI10.1117/12.20713
  • 页码121-131
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