Thickness Dependence of Electrical and Structural Properties of FTO Films
- 作者F. M. Amanullah; K. J. Pratap; Prof. V. Hari Babu
- 卷第26卷
- 期第8期
- 印刷ISSN0232-1300
- 电子ISSN1521-4079
- 文件大小291.54KB
- 发表时间1991
- DOI10.1002/crat.2170260826
- 页码1099-1105
同作者推荐
Temperature Dependence of Critical Sample Thickness for Spontaneous Cholesteric-Nematic Phase Transition Between Surfaces with Homeotropic AnchoringDr. S. Pirkl · 1991
Electric Field-Induced Phase Transitions in Electro-Optic Cell with Dielectrically Negative Chiral Nematic Liquid CrystalDr. S. Pirkl · 1993