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[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - Breakdown of a thin dielectric liquid layer and interfacial phenomena

[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - Breakdown of a thin dielectric liquid layer and interfacial phenomena

Brosseau, C.

作者Brosseau, C.
文件大小393.22KB
发表时间1991
DOI10.1109/icpadm.1991.172046
页码257-260

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