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[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - The impact ionization and breakdown strength in atomic liquids with molecular impurities

[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - The impact ionization and breakdown strength in atomic liquids with molecular impurities

Atrazhev, V.M.

作者Atrazhev, V.M.
文件大小329.04KB
发表时间1991
DOI10.1109/icpadm.1991.172051
页码288-291

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