[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Relation between hot-carrier light emission and kink effect in poly-Si thin film transistors
- 作者Koyanagi, M.; Kurino, H.; Hashimoto, T.; Mori, H.; Hata, K.; Hiruma, Y.; Fujimori, T.; Wu, I.-W.; Lewis, A.G.
- 文件大小358.21KB
- 发表时间1991
- DOI10.1109/iedm.1991.235405
- 页码571-574
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