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[IEEE Comput. Soc. Press Proceedings IEEE International Symposium on Intelligent Control 1988 - Arlington, VA, USA (24-26 Aug. 1988)] Proceedings IEEE International Symposium on Intelligent Control 1988 - MetadiagnosisYue, O.; Lirov, Y. · 1989
[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Current testingMaly, W. · 1990
[IEEE Comput. Soc. Press Proceedings. IEEE International Symposium on Intelligent Control 1989 - Albany, NY, USA (25-26 Sept. 1989)] Proceedings. IEEE International Symposium on Intelligent Control 1989 - Autonomous manufacturing systemsBaldwin, K.E. · 1989
[IEEE Comput. Soc. Press Proceedings. IEEE International Symposium on Intelligent Control 1989 - Albany, NY, USA (25-26 Sept. 1989)] Proceedings. IEEE International Symposium on Intelligent Control 1989 - Accumulating qualitative knowledgeKokar, M.M. · 1989
[IEEE Comput. Soc. Press Proceedings IEEE International Symposium on Intelligent Control 1988 - Arlington, VA, USA (24-26 Aug. 1988)] Proceedings IEEE International Symposium on Intelligent Control 1988 - Limits of logicVamos, T. · 1989
[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Concurrent engineeringLowenstein, A.; Schlosser, S.; Winter, G. · 1990
[IEEE Comput. Soc. Press Proceedings IEEE International Symposium on Intelligent Control 1988 - Arlington, VA, USA (1988.08.24-1988.08.26)] Proceedings IEEE International Symposium on Intelligent Control 1988 - Proceedings IEEE International Symposium on Intelligent Control 19881988
[IEEE Comput. Soc. Press Proceedings IEEE International Symposium on Intelligent Control 1988 - Arlington, VA, USA (24-26 Aug. 1988)] Proceedings IEEE International Symposium on Intelligent Control 1988 - Generic manufacturing controllersCatron, B.A.; Thomas, B.H. · 1989