SPIE Proceedings [SPIE San Diego, '91, San Diego, CA - San Diego, CA (Sunday 21 July 1991)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II - Uniformity and transmission of proportional counter window materials for use with AXAF
Flanagan, Kathryn A.; Austin, Gerald K.; Cobuzzi, J. C.; Goddard, Richard E.; Hughes, John P.; McLaughlin, Edward; Podgorski, William A.; Rose, Vincent D.; Roy, Adrian G.; Zombeck, Martin V.; Markert, Thomas H.; Bauer, James M.; Isobe, Takashi; Schattenburg, Mark L.; Siegmund, Oswald H. W.; Rothschild, Richard E.
- 作者Flanagan, Kathryn A.; Austin, Gerald K.; Cobuzzi, J. C.; Goddard, Richard E.; Hughes, John P.; McLaughlin, Edward; Podgorski, William A.; Rose, Vincent D.; Roy, Adrian G.; Zombeck, Martin V.; Markert, Thomas H.; Bauer, James M.; Isobe, Takashi; Schattenburg, Mark L.; Siegmund, Oswald H. W.; Rothschild, Richard E.
- 卷第1549卷
- 印刷ISSN0277-786X
- 文件大小688.17KB
- 发表时间1991
- DOI10.1117/12.48356
- 页码395-407