SPIE Proceedings [SPIE ECO4 (The Hague '91) - The Hague, Netherlands (Monday 11 March 1991)] Industrial Applications of Holographic and Speckle Measuring Techniques - Holography as a tool for widespread industrial applications: analysis and comments
Smigielski, Paul; Jueptner, Werner P. O.
- 作者Smigielski, Paul; Jueptner, Werner P. O.
- 卷第1508卷
- 印刷ISSN0277-786X
- 文件大小994.77KB
- 发表时间1991
- DOI10.1117/12.47087
- 页码38-49