Development of OXSIM2D: A Simulation Program of SiO2 Growth and Stress Generation in Thermal Oxidation Process of Silicon.
SAITO, Naoto; SAKATA, Shinji; IKEGAWA, Masahiro; MIURA, Hideo; OHTA, Hiroyuki; SHIMIZU, Tasuku; ISOMAE, Seiichi; MASUDA, Hiroo
- 期刊名称Transactions of the Japan Society of Mechanical Engineers Series A
- 作者SAITO, Naoto; SAKATA, Shinji; IKEGAWA, Masahiro; MIURA, Hideo; OHTA, Hiroyuki; SHIMIZU, Tasuku; ISOMAE, Seiichi; MASUDA, Hiroo
- 卷第57卷
- 期第541期
- 印刷ISSN0387-5008
- 电子ISSN1884-8338
- 文件大小690.84KB
- 发表时间1991
- DOI10.1299/kikaia.57.2057
- 页码2057-2062