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Source-optics polarization effects on ellipsometry analysisStagg, B. J.; Charalampopoulos, T. T. · ao/33/16/ao-33-16-3493.pdf · 1994
Surface-roughness effects on the determination of optical properties of materials by the reflection methodStagg, B. J.; Charalampopoulos, T. T. · ao/30/28/ao-30-28-4113.pdf · 1991
Sensitivity of the reflection technique: optimum angles of incidence to determine the optical properties of materialsStagg, B. J.; Charalampopoulos, T. T. · ao/31/22/ao-31-22-4420.pdf · 1992