Measurement of the resistance of metal-semiconductor-metal structures using the geometrical magnetoresistance technique
- 作者Andrzej Wolkenberg; Tomasz Przesławski; Jerzy Klamka
- 卷第35卷
- 期第1期
- 印刷ISSN0038-1101
- 文件大小302.78KB
- 发表时间1992
- DOI10.1016/0038-1101(92)90305-v
- 页码61-65