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[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - Proposal of standard characterization method for dynamic circuit performance

[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - Proposal of standard characterization method for dynamic circuit performance

Fujishima, M.; Asada, K.
  • 作者Fujishima, M.; Asada, K.
  • 文件大小347.56KB
  • 发表时间1992
  • DOI10.1109/icmts.1993.292915
  • 页码227-232
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