[IEEE Sixth International Conference Metalorganic Vapor Phase Epitaxy - Cambridge, MA (June 8-11, 1992)] Sixth International Conference Metalorganic Vapor Phase Epitaxy - Optical Characterization of GalnP Layers
- 作者Moser, M.; Geng, C.; Lath, E.; Scholz, F.; Schweizer, H.
- 文件大小120.13KB
- 发表时间1992
- DOI10.1109/movpe.1992.665021
- 页码210-211
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