[IEEE Digest of Papers. 1992 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (7-9 April 1992)] Digest of Papers. 1992 IEEE VLSI Test Symposium - Empirical bounds on fault coverage loss due to LFSR aliasing

• 作者Debany, W.H.; Gorniak, M.J.; Daskiewich, D.E.; Macera, A.R.; Kwiat, K.A.; Dussault, H.B.
• 文件大小470.61KB
• 发表时间1992
• DOI10.1109/vtest.1992.232739
• 页码143-148