Reflectometry as a fluctuation diagnostic: A one-dimensional simulation
- 期刊名称Review of Scientific Instruments
- 作者Chou, A. E.; Luhmann, N. C.; Peebles, W. A.; Rhodes, T. L.
- 卷第63卷
- 期第10期
- 印刷ISSN0034-6748
- 文件大小664.42KB
- 发表时间1992
- DOI10.1063/1.1143658
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