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Simple method of depth profiling (stratifying) contamination layers, illustrated by studies on stainless steelM. P. Seah; J. H. Qiu; P. J. Cumpson; J. E. Castle · 1994
Sputter-induced cone and filament formation on InP and AFM tip shape determinationM. P. Seah; S. J. Spencer; P. J. Cumpson; J. E. Johnstone · 2000
Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesisP. J. Cumpson; M. P. Seah · 1992
Simple Procedure for Precise Peak Maximum Estimation for Energy Calibration inAES andXPSCumpson, P. J.; Seah, M. P.; Spencer, S. J. · Surface and Interface Analysis · 1996