SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Systematic optical study of In<formula><inf><roman>x</roman></inf></formula>Ga<formula><inf><roman>1-x</roman></inf></formula>As on InP using photoluminescence, photoreflectance, and micro-Raman spectroscopy
Estrera, Joseph P.; Duncan, Walter M.; Kao, Yung C.; Liu, H. Y.; Stevens, Patrick D.; Beam III, E. A.; Glembocki, Orest J.
- 作者Estrera, Joseph P.; Duncan, Walter M.; Kao, Yung C.; Liu, H. Y.; Stevens, Patrick D.; Beam III, E. A.; Glembocki, Orest J.
- 卷第1678卷
- 印刷ISSN0277-786X
- 文件大小516.03KB
- 发表时间1992
- DOI10.1117/12.60447
- 页码120-130