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XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfaces

XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfaces

U. Rothhaar; V. Rupertus; H. Oechsner

作者U. Rothhaar; V. Rupertus; H. Oechsner
卷第346卷
印刷ISSN0937-0633
电子ISSN1432-1130
文件大小306.73KB
发表时间1993-05-13
DOI10.1007/bf00321390
页码96-98

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