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RbBr/Si(111) interface studied by the X-ray standing wave method

RbBr/Si(111) interface studied by the X-ray standing wave method

V. Eteläniemi; E.G. Michel; G. Materlik
  • 作者V. Eteläniemi; E.G. Michel; G. Materlik
  • 文件大小500.14KB
  • 发表时间1993
  • DOI10.1016/0039-6028(93)90788-l
  • 页码288-293
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