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Studying aerosol samples by non-linear mapping of electron probe microanalysis data

Studying aerosol samples by non-linear mapping of electron probe microanalysis data

B. Treiger; H. Van Malderen; I. Bondarenko; P. Van Espen; R. Van Grieken

作者B. Treiger; H. Van Malderen; I. Bondarenko; P. Van Espen; R. Van Grieken
卷第284卷
期第1期
印刷ISSN0003-2670
文件大小510.86KB
发表时间1993
DOI10.1016/0003-2670(93)80014-c
页码119-124

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