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[IEEE Electrical/Electronics Insulation Conference - Chicago, IL, USA (4-7 Oct. 1993)] Proceedings of Electrical/Electronics Insulation Conference - An optical technique to detect the degradation of electrical insulation

[IEEE Electrical/Electronics Insulation Conference - Chicago, IL, USA (4-7 Oct. 1993)] Proceedings of Electrical/Electronics Insulation Conference - An optical technique to detect the degradation of electrical insulation

Bamji, S.S.; Bulinski, A.T.; Shen, J.

作者Bamji, S.S.; Bulinski, A.T.; Shen, J.
文件大小440.52KB
发表时间1993
DOI10.1109/EEIC.1993.631303
页码643-647

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