Semiconductor Growth, Surfaces and Interfaces || In Situ Characterization and Control of Compound Semiconductor Interfaces
- 期刊名称Philosophical Transactions: Physical Sciences and Engineering
- 作者Hideki Hasegawa
- 卷第344卷
- 期第1673期
- 印刷ISSN0962-8428
- 文件大小322.53KB
- 发表时间1993-09-15
- DOI10.2307/54126
- 页码587-595
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