![[IEEE 1993 (5th) International Conference on Indium Phosphide and Related Materials - Paris, France (19-22 April 1993)] 1993 (5th) International Conference on Indium Phosphide and Related Materials - Experimental characterization of interface roughness in strained InGaAs/InP MQWs after a growth interruption sequence]()
[IEEE 1993 (5th) International Conference on Indium Phosphide and Related Materials - Paris, France (19-22 April 1993)] 1993 (5th) International Conference on Indium Phosphide and Related Materials - Experimental characterization of interface roughness in strained InGaAs/InP MQWs after a growth interruption sequenceJuillaguet, S.; Schwedler, R.; Kohl, A.; Baumann, F.H.; Fraisse, B.; Camassel, J.; Wolter, K.; Leo, K.; Gallmann, B.; Stollenwerck, M.; Laurenti, J.P. · 1993