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[IEEE 1993 IEEE Instrumentation and Measurement Technology Conference - Irvine, CA, USA (18-20 May 1993)] 1993 IEEE Instrumentation and Measurement Technology Conference - Fitting the exogenous model to measured data

[IEEE 1993 IEEE Instrumentation and Measurement Technology Conference - Irvine, CA, USA (18-20 May 1993)] 1993 IEEE Instrumentation and Measurement Technology Conference - Fitting the exogenous model to measured data

Conte, E.; Lops, M.; Ricci, G.

作者Conte, E.; Lops, M.; Ricci, G.
文件大小485.27KB
发表时间1993
DOI10.1109/imtc.1993.382617
页码366-370

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