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[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Mission relevant testing

[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Mission relevant testing

Lopez, M.; Horman, M.; Luu, T.; Orlando, H.

作者Lopez, M.; Horman, M.; Luu, T.; Orlando, H.
文件大小335.20KB
发表时间1993
DOI10.1109/naecon.1993.290809
页码987-990

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