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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Universal test set generation for CMOS circuits

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Universal test set generation for CMOS circuits

Chen, B.; Lee, C.L.

作者Chen, B.; Lee, C.L.
文件大小600.87KB
发表时间1993
DOI10.1109/ats.1993.398765
页码20-25

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