[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A global BIST methodology
- 作者Gheewala, T.; Sucar, H.; Varma, P.
- 文件大小719.26KB
- 发表时间1993
- DOI10.1109/ats.1993.398795
- 页码154-159
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