Standardized ferroelectric capacitor test methodology for nonvolatile semiconductor memory applications

Bernacki, Steve; Jack, Larry; Kisler, Yanina; Collins, Steve; Bernstein, S. D.; Hallock, Rob; Armstrong, Bruce; Shaw, Jerry; Evans, Joe; Tuttle, Bruce; Hammetter, Bill; Rogers, Steve; Nasby, Bob; Henderson, Jack; Benedetto, Joe; Moore, Randy; Pugh, Cpt Robert; Fennelly, Al

期刊名称Integrated Ferroelectrics
作者Bernacki, Steve; Jack, Larry; Kisler, Yanina; Collins, Steve; Bernstein, S. D.; Hallock, Rob; Armstrong, Bruce; Shaw, Jerry; Evans, Joe; Tuttle, Bruce; Hammetter, Bill; Rogers, Steve; Nasby, Bob; Henderson, Jack; Benedetto, Joe; Moore, Randy; Pugh, Cpt Robert; Fennelly, Al
卷第3卷
期第2期
印刷ISSN1058-4587
电子ISSN1607-8489
文件大小966.59KB
发表时间1993-06
DOI10.1080/10584589308216704
页码97-112

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Standardized ferroelectric capacitor test methodology for nonvolatile semiconductor memory applications