[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A new method for system diagnosis
- 作者Xu, S.; Gao, J.
- 文件大小367.54KB
- 发表时间1993
- DOI10.1109/ats.1993.398794
- 页码147-152
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