SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Interferometry: Applications - Interferometric length measurements
- 作者Ikonen, Erkki; Lassila, Antti; Luukkainen, J.; Riski, Kari; Pryputniewicz, Ryszard J.; Brown, Gordon M.; Jueptner, Werner P. O.
- 卷第1756卷
- 印刷ISSN0277-786X
- 文件大小441.39KB
- 发表时间1993
- DOI10.1117/12.140790
- 页码86-97
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